What the data for this category looks like
Data sources for semiconductor intelligent due diligence reports cover publicly disclosed information from design companies, wafer foundries, and packaging and testing enterprises, as well as publicly monitored industry supply chain data. Update frequencies fall into three categories: monthly (wafer production capacity, material quotes), quarterly (enterprise revenue, customer structure), and real-time (patent application publications). Documents primarily use structured fields paired with unstructured analysis paragraphs. Core fields include process node (unit: nanometers), monthly production capacity (unit: ten thousand wafers/month), revenue (unit: million USD), patent application number, and some documents include hierarchical structure data for material BOMs.
What constraints these characteristics impose on multi-turn conversation and prompt engineering
Differences in update frequencies across data sources require multi-turn conversations to distinguish valid time ranges for data, and avoid using expired production capacity or quote data. Fixed units and hierarchical structures for professional fields require prompt engineering to embed unit verification and field association rules, preventing LLMs from confusing parameter meanings. The combination of long text and multi-dimensional fields requires multi-turn conversations to first split structured fields for extraction before conducting comprehensive analysis, avoiding information omission caused by generalized questions. Additionally, semiconductor due diligence inputs often contain large volumes of professional codes, requiring restriction of redundant information in the context window to ensure core parameters are processed first.
How to set configurations
| Configuration Item | Recommended Range | Rationale |
|---|---|---|
maxConversationContext | 8000–12000 tokens | Semiconductor due diligence reports include multi-dimensional structured fields and long-text analysis, requiring sufficient context to associate parameters across different modules |
segment length | 1000–1500 characters | Semiconductor data includes professional units and long sentences; splitting avoids LLM loss of field associations while reducing per-round processing load |
similarity threshold | 0.75–0.85 | Filter low-relevance supply chain quotes and production capacity data, only recall semiconductor professional data matching the current query |
number of recalled entries | Top 6–8 entries | Balance information completeness and context window usage, cover three core data types: process, production capacity, and customers |
temperature | 0.2–0.4 | Maintain accuracy of professional semiconductor terminology, avoid generating parameter values that do not comply with industry standards |
maxPromptTokens | 2000–2500 tokens | Reserve sufficient space to load structured field rules for semiconductor due diligence and historical conversation context |
The parameter values provided on this page are common recommended starting points for configuration. Actual values are affected by material form, data volume, and business rules. Specific issues require targeted analysis, and it is recommended to test on your own samples before finalizing settings.
Three common mistakes
- Symptom: After entering a semiconductor due diligence topic once, preset prompts cannot trigger parallel processing and merged output. The result only covers the scope of a single prompt set. Cause: Multi-turn task nodes are not configured via workflow, and the same input is not distributed to multiple prompt templates before merging results.
- Symptom: Semiconductor professional fields returned in conversations have incorrect units, for example, labeling wafer production capacity as "pieces" instead of the correct unit "ten thousand wafers/month". Cause: Prompt engineering does not embed unit verification rules, and standard field units for semiconductor data are not specified in the configuration.
- Symptom: When calling an external interface to connect to a conversation application, a
401 Unauthorizederror is returned, and response content cannot be obtained. Cause: The binding relationship between the application key and appId is not configured correctly, and requests use an unofficial key format.
How to confirm proper configuration
- Upload a sample semiconductor due diligence document, view the parsed field list, and confirm that core fields such as process node, monthly production capacity, and revenue are included.
- Initiate a test conversation with multi-dimensional queries, such as asking for both a company's process node and customer concentration, and check if the returned results associate document content from different modules.
- Review conversation logs, confirm that the context is not truncated, and there are no timeout-related error records.
- Test the parallel call workflow for multiple prompt sets, confirm that input content is distributed to all preset templates before merging output, with no missing query scopes.
Question material comes from public community discussions. Configuration values are common starting points and should be measured against your own samples. Verified on 2026-09-14.