What data looks like for this category
Semiconductor due diligence data comes from industry association public research, listed companies’ regular financial reports, patent public databases, supply chain vendor disclosure documents, and EDA design specification documents. Update frequencies include quarterly industry reports, monthly production capacity data, and real-time patent and supply chain updates. Documents mostly use structured tables paired with paragraph explanations. They include fields such as process node, production capacity scale, and unit cost. Units include nanometers, ten thousand wafers per month, and USD per unit. Some documents contain long technical detail paragraphs.
Constraints imposed on knowledge base retrieval and recall
The multi-source, multi-structure nature of semiconductor due diligence data requires the retrieval link to adapt to both structured fields and unstructured paragraphs. High-precision parameter requirements such as process node values require recall results to strictly match field semantics, to avoid incorrect associations caused by fuzzy matching. Dynamically updated supply chain and production capacity data requires the knowledge base to support filtering recall entries by update time, to ensure result timeliness. The existence of long documents such as corporate financial reports and full patent texts requires retaining field association relationships during chunking, to avoid losing contextual semantics after splitting.
How to set configurations
| Configuration Item | Recommended Setting | Rationale |
|---|---|---|
PARSE_CHUNK_SIZE | 800–1200 characters | Semiconductor documents contain long parameter paragraphs and structured tables. This range preserves field associations while avoiding overly long single chunks that impair recall |
RECALL_TOP_K | Top 8–12 entries | Due diligence reports require coverage of multi-dimensional data. Too many entries increase context burden, too few risk missing critical parameters |
SIMILARITY_THRESHOLD | 0.75–0.85 | Semiconductor parameters require precise matching. A threshold that is too low will introduce irrelevant entries, while a threshold that is too high may miss valid data with different phrasing for the same category |
UPLOAD_SEPARATOR | Custom separator set to \r\n | Most semiconductor datasets are in CSV format. This matches the line separator rules of most locally exported files, avoiding incorrect line splitting |
MAX_CONTEXT_LENGTH | 6000–8000 characters | Due diligence reports require integrating multi-source data. This range can carry enough recall entries while complying with model input limits |
AUTH_CHECK_ENABLED | Enabled | Semiconductor due diligence data involves industry-sensitive information. Access scope control via user authentication is required |
The parameter values provided on this page are common starting points for configuration. Actual values are affected by material format, data volume, and business rules. Specific issues require case-by-case analysis. It is recommended to test on your own samples before finalizing settings.
Three common mistakes
- When uploading a CSV file, the custom separator does not take effect, and the file is incorrectly split into a single line. The cause is failing to match the actual line separator used by the file. Some CSV files use
\nas the line break identifier instead of\r\n. - After configuring authentication for the knowledge base search node, unauthenticated access is still allowed, returning a
403 Forbiddenerror or empty results. The cause is that the authentication configuration is not bound to the corresponding knowledge base search node, or the node does not have an access whitelist configured. - When selecting a variable reference for the knowledge base search node, no optional values are available, and input parameters cannot be bound. The cause is that input variables are not configured in the workflow node, or the input variables are not defined as string type.
How to confirm proper configuration
- Upload a test semiconductor CSV dataset, check that chunked results are split according to the configured separator, with no incorrect cross-line or missing line situations.
- Enter a query related to semiconductor process nodes or production capacity, verify that the similarity of recall results falls within the preset threshold range, and that the number of entries matches the configured recall count.
- After configuring authentication, initiate a query using an unauthorized account, confirm that the returned result is empty or prompts insufficient permissions.
- Bind a configured input variable to the knowledge base search node, confirm that the variable reference option displays normally and can be selected.
Question material comes from public community discussions. Configuration values are common starting points and should be measured against your own samples. Verified on 2026-09-14.