What this category of data looks like
Typically, data related to supplier and process quality audit for crystalline silicon cell manufacturing comes from wafer incoming material records, workshop MES systems, diffusion furnace/coating/printing equipment logs, EL and IV test results, and laboratory test reports. Daily documents include process cards, diffusion and coating parameters, printing and sintering records, EL detection images, IV grading data, and yield reports. Data update cycles follow per batch incoming material, per piece test result, and daily summary. Fields include process parameter values, defect types, electrical performance indicators, batch traceability codes, and other relevant information.
What constraints these characteristics impose on the "HTTP Interfaces and External Systems" link
Multi-source heterogeneous data sources require interfaces to support requests and responses in different formats, to adapt to data synchronization for different types such as equipment logs and test reports. The high-frequency update cycle (per batch, per piece, daily) requires interfaces to have low latency and high concurrent processing capabilities to avoid data backlog. The existence of image data such as EL detection images requires interfaces to support binary or multipart form data transmission. The core requirement of batch traceability requires interfaces to carry unique business identification parameters to ensure precise binding of data to corresponding batches. At the same time, the requirement for accuracy of defect identification and grading requires interfaces to return complete verification fields to avoid missing key information.
How to set configurations
| Configuration Item | Recommended Value | Rationale |
|---|---|---|
Authorization | Bearer {Enterprise-specific API key} | Photovoltaic cell production data belongs to workshop-sensitive data. Standard Bearer token authentication is required to prevent unauthorized access |
variables | {"batchId": "string", "testType": "EL/IV"} | Matches business requirements for batch traceability and multi-type detection, and transmits core business identification parameters |
responseData | include defectInfo, ivScore, batchTrace | Only returns core fields required for audit, reducing data transmission volume and adapting to high-frequency data synchronization scenarios |
| File transfer format | multipart/form-data, maximum 100 MB per file | A single EL detection image is usually no larger than 50 MB. The maximum upload threshold is set based on actual measurements |
| Number of failed retries | 3 times | Adapts to scenarios of occasional device disconnections, avoiding data loss caused by a single failed request |
| Streaming return switch | true / false | Use streaming return for real-time audit scenarios, non-streaming for batch synchronization scenarios |
Three common mistakes
- Phenomenon: The interface returns a 401 Unauthorized status code, and a connection cannot be established normally. Cause: The
Authorizationparameter is not configured correctly, the enterprise-specific API key is not carried, or the key format does not comply with Bearer token specifications. - Phenomenon: When the
streamparameter is set to true, only partial segmented data is received, and the complete audit result cannot be obtained. Cause: The processing does not follow the segmented splicing logic of streaming responses, and the end of the lastdata: [DONE]marker is not waited for. - Phenomenon: After uploading an EL detection image, the interface returns a parameter format error. Cause: The image is not transmitted using the
multipart/form-dataformat, and the image binary data is mistakenly converted to a Base64 string and placed in the JSON request body.
How to confirm the configuration is correct
- Use the workflow API of FastGPT v4.17.0 to send a test request with the correct
Authorizationparameter, and confirm that the returned status code is 200 OK. - Enable the streaming return switch, receive response data segment by segment, and confirm that the final audit result containing defect information and electrical performance indicators can be completely spliced.
- Upload a test EL detection image, submit it using the
multipart/form-dataformat, and confirm that the interface can correctly parse and return the corresponding detection fields. - Configure a batch synchronization task, and check whether the
responseDatafield returned by the interface includes preset core business information such as batch traceability codes and process parameters.
The values provided here are common starting points and should be evaluated against the reader's own samples.