This document is written based on FastGPT v4.17.0.
What This Category of Data Looks Like
Semiconductor packaging and testing process and exception documents include packaging process cards, bonding and molding parameter tables, wafer incoming material maps, test program version files, yield reports and failure analysis reports. Data comes from wafer test maps, MES systems, bonding and molding equipment, ATE test machines, X-ray/SAM testing equipment, and customer specification requirements. Data is updated by production batch, individual test result, and daily frequency. Document fields include batch number, wafer position, test bin classification, parameter thresholds, failure type, and more. Units involve wafer diameter, test voltage, failure position coordinates, and others.
What Constraints Do These Characteristics Impose on the "HTTP Interfaces and External Systems" Link
Multi-source scattered data, high-frequency fine-grained updates, diverse field units, and personalized customer requirements in semiconductor packaging and testing create multiple constraints for HTTP interface and external system docking. Teams must support compatibility with different data formats and encryption rules of multiple devices such as MES and ATE test machines to avoid data parsing failures. Teams must adapt to different update rhythms: production batches, individual test results, daily updates, and set reasonable request thresholds to avoid system overload. Teams must support custom field mapping to convert raw device data into standard fields for process documents and exception reports, and adjust interface parameters to meet the specification requirements of different customers.
How to Set the Configuration
| Configuration Item | Recommended Value | Rationale |
|---|---|---|
Authorization | Bearer ${device_auth_token} | Complies with HTTP interface standard authentication format, and adapts to the permission verification requirements of packaging and testing equipment and MES systems |
variables | {"batchNo": "", "waferLot": "", "testBin": ""} | Matches the core business fields of process documents and exception reports, supports dynamic passing of production batches and test data |
responseData | filter(item => item.testResult !== "pending") | Only extracts completed test data, filters out invalid request results that are not yet completed |
| Request timeout | 60 seconds | Adapts to the data return cycle of ATE test machines, avoids interface call failures caused by network delays |
| Batch request limit | First 200 entries | Adapts to the conventional data volume of a single batch of semiconductor packaging and testing, avoids interface overload |
| Field mapping rules | Calibrated based on actual measurements | Adapts to differences in raw fields of different devices, ensures data conversion meets business document requirements |
Three Common Mistakes
- Calling the published tool flow API returns empty data. The cause is that the
responseDatafiltering rule is not configured correctly, and test data that meets business requirements is not screened out. - The generated exception report is missing test bin classification information. The cause is that the corresponding mapping field is not configured in
variables, and the bin value returned by the ATE test machine is not converted into the report field. - Interface calls frequently trigger timeout errors. The cause is that the request timeout is set too short, which does not adapt to the average data return cycle of the ATE test machine, resulting in interrupted unfinished test requests.
How to Confirm the Configuration Is Correct
- Initiate a test request, check whether the returned
responseDatacontains the expected test data fields, and there is no invalid pending status data. - View the interface call log, confirm that the
Authorizationparameter is correctly carried, and there are no unauthorized error records. - Generate a simulated process document, check whether the incoming
variablesparameters are correctly mapped to fields such as batch number and wafer information in the document. - Simulate requests at conventional production frequencies, confirm that the interface does not trigger abnormal errors, and data transmission meets expectations.
The values provided here are common starting points and should be measured against the reader's own samples.