What the data for this category looks like
Semiconductor packaging and testing business data sources include wafer test maps, MES systems, bonding and molding equipment logs, ATE tester data, X-ray/SAM inspection reports, and customer specifications. Daily generated documents include packaging process cards, bonding and molding parameter tables, wafer incoming material maps, test program version files, yield reports, and failure analysis reports. Data is updated according to production batches, single-chip test results, and daily equipment logs. Document fields include professional parameters such as wafer batch number, bonding temperature, molding pressure, test bin code, and yield value.
What constraints these characteristics impose on the multi-turn dialogue and prompt engineering link
Since data is updated by production batch and single test result, multi-turn dialogue must bind a unique batch identifier to avoid context confusion. Documents contain a large number of professional equipment parameters and test indicators. Prompt engineering needs to preset professional fields to guide accurate retrieval. Multi-source data comes from different devices and systems. Dialogue needs to associate data sources from different index libraries, while controlling context length to meet the demand for simultaneous display of multiple documents. In addition, drafting exception reports requires associating complete test chain data for a batch. Multi-turn dialogue needs to support step-by-step tracing of preceding parameters.
How to set the configurations
The following configurations are based on FastGPT v4.17.0.
| Configuration Item | Recommended Setting | Rationale |
|---|---|---|
chatId | Bind the unique identifier of the current production batch | Used to associate process data and test results of the same batch in multi-turn dialogue, avoiding context confusion |
messages | Preset opening remarks including wafer batch number and bonding parameter queries | Guide users to quickly input core business information, align with professional packaging and testing scenarios |
variables | Preset fields including wafer batch number, bin code statistical range, and yield threshold | Automatically fill business variables to reduce manual input errors |
| Maximum number of recalled documents per single request | Top 10 entries | Matches the conventional data volume of packaging and testing documents for a single batch, avoiding context overload |
| Context window size | 8000–12000 token | Adapts to the total length of multiple documents such as equipment logs and test reports that need to be associated in multi-turn dialogue |
| Question optimization switch | Enabled | Convert users' colloquial queries into retrieval instructions that conform to packaging and testing terminology, improving retrieval accuracy |
Three common misconfigurations
- The dialogue opening only presets a single question, which cannot cover multi-dimensional business queries. This happens because multiple preset business questions are not configured in
messages, so users cannot quickly trigger retrieval for corresponding scenarios. - The dialogue returns a 404 status code (no body). This happens because the business fields configured in
variableshave no corresponding mapping in the index library, or context parameters are not passed correctly when calling the model. - Refreshing the page displays "No available index model detected". This happens because exclusive documents such as packaging process cards and yield reports have not been uploaded to the index library bound to the dialogue agent, or index configuration has not completed verification.
How to confirm the configuration is complete
- Create a new dialogue, enter the preset wafer batch number, and check if
chatIdautomatically binds the process data of the corresponding batch. - Send a test query, and check if the dialogue returns the content of the preset
variablesfields without 404-type errors. - Click the source identifier in the response, and confirm that you can jump to the original page of the corresponding packaging document.
- Refresh the dialogue page, and confirm that the prompt "No available index model detected" is not displayed.
The values provided are common starting points and should be measured against the reader's own samples.