What this type of data looks like
Daily documentation for photovoltaic cell manufacturing includes process cards, diffusion and coating parameters, printing and sintering records, EL detection images, IV grading data, and yield reports. Data sources include silicon wafer incoming materials, MES systems, diffusion furnaces, coating equipment, printing presses, EL and IV testing equipment, and laboratory data. Update cycles follow production batches, single-chip test results, and daily summaries. Documentation includes precise process parameters and unstructured detection images, with fields covering physical quantities such as temperature, thickness, and grid line width. No batch templates with a unified fixed format exist.
What constraints do these characteristics impose on the HTTP Interfaces and External Systems workflow
Multiple heterogeneous data sources require HTTP interfaces to be compatible with different external system authentication rules. Frequent update cycles require interfaces to support small-volume, high-frequency requests to avoid overload. Mixed structured parameters and unstructured image document formats require interfaces to support multipart form uploads. Precise process fields require interfaces to have strict parameter verification capabilities to prevent invalid data from entering the review workflow. Additionally, the need to link wafer-level and batch-level data requires interfaces to bind business identifiers for data traceability.
How to configure the settings
The following configurations apply to the interface and external system integration logic for FastGPT v4.17.0:
| Configuration Item | Recommended Setting | Rationale |
|---|---|---|
Authorization | Select Bearer Token or Basic Auth based on external system type, with a value of 128–2048 characters | Adapts to authentication requirements of multiple external systems such as MES and equipment systems, and ensures interface access security |
| Timeout | 60–120 seconds | Adapts to the time required for single-batch document upload and parsing, avoiding timeout interruptions during high-frequency requests |
| Number of files per request | 1–5 | Matches the number of documents per single wafer or production batch, avoiding request overload |
responseData | Return only structured parameters and file verification results | Focuses on core fields of process and detection data, reducing invalid data transmission |
variables | Bind batch number and equipment ID as context variables | Links business identifiers of external systems, facilitating subsequent process review and data traceability |
Three common configuration errors
- Interface calls return a connection error status code or an unauthorized prompt. The cause is failure to configure the
Authorizationparameter according to the external system type, resulting in authentication failure and interception by the external system. - API call responses do not include knowledge base document content. The cause is failure to bind the business identifier of the corresponding batch through
variables, making it impossible to retrieve matching process cards or detection data. - Custom parsing service requests time out. The cause is a timeout setting lower than 60 seconds, which cannot complete the full parsing process for EL detection images or IV data.
How to confirm the configuration is correct
- A test interface call is initiated, and the returned
responseDatais verified to include expected process parameter fields with no unnecessary extra content. - A single-batch document upload is simulated, and the interface is confirmed to return parsing results within 60–120 seconds with no timeout errors.
- The
Authorizationparameter is checked to match the authentication rules of the external system, and connectivity is verified by sending a test request using a tool. - The batch number variable in
variablesis bound, and after a call is initiated, retrieved documents are confirmed to match the process records of the corresponding batch.
The values provided are common starting points and should be measured against the user’s own samples.