What the data for this category looks like
Daily data sources for photovoltaic cell manufacturing include silicon wafer incoming material ledgers, production MES systems, operation logs from diffusion furnaces, coating equipment, and printing presses, test data from EL (electroluminescence) and IV (current-voltage) tests, and laboratory physicochemical analysis reports. Data updates follow three patterns: synchronized per production batch, updated in real time after each wafer test, and summarized daily to generate yield reports. Typical documents include process cards, diffusion and coating parameter tables, printing and sintering records, EL defect detection images, IV grading data, and batch yield reports. Fields covered include monocrystalline silicon wafer ID, process temperature, defect area, conversion efficiency value, and more. There is no unified fixed format, so data must be matched to production batches and associated with equipment numbers.
Constraints on citation sources and traceability
Multiple scattered data sources require citations to accurately link to specific production batches, equipment numbers, and monocrystalline silicon wafer IDs, to avoid cross-batch confusion. High-frequency data updates mean cited sources must match the current production window. Expired historical data cannot be used. Diverse document structures require traceability functions to support original data in multiple formats, including tables, charts, and logs. Dual data dimensions of wafer-level and batch-level information require citations to associate both individual monocrystalline silicon wafer details and overall batch parameters. This ensures accuracy of process adjustments. High precision requirements for process parameters mean cited original data must retain complete field details. Key information cannot be simplified or truncated.
How to configure settings
The following configurations are explained based on FastGPT v4.17.0.
| Configuration Item | Recommended Setting | Rationale |
|---|---|---|
quoteMaxToken | 800–1200 token | Photovoltaic cell manufacturing process documents include multiple sets of parameters and batch information. Sufficient token capacity is needed to hold cited original data entries |
responseData | Return batch number, equipment ID, and monocrystalline silicon wafer ID | Citation results must be bound to specific production links to let process personnel quickly trace original data sources |
detail | Enable full field return | Process adjustments require reference to specific details such as temperature and test values. Full field returns prevent loss of key information |
| Add citations at end of response | Enable | Process personnel need to quickly locate original documents corresponding to responses, without additional retrieval to view sources |
| Multi-turn dialogue context association | 5–7 turns of dialogue | Process issues usually involve continuous production steps. Limiting context turns ensures consistent response logic for consecutive questions |
| Share citation permissions without login | Configure per scenario | On-site process personnel often need to access applications without login. This ensures citation functions work normally in shared scenarios |
Three common configuration errors
- When accessing the application via a login-free shared link, the citation viewing function shows as unavailable, and cannot jump to the original data source. Cause: Citation permissions are not enabled in shared configurations, so unauthenticated users lack access to original data.
- No citation markers or source information appear at the end of paragraphs in knowledge base responses. Cause: The "Add citations at end of response" function switch is not enabled, or the configured
quoteMaxTokenvalue is too low to hold citation source information. - During consecutive questions, the second and subsequent questions cannot associate historical context, and responses do not match the current production scenario. Cause: The multi-turn dialogue context association configuration is not enabled, or the context turn setting exceeds a reasonable range, causing historical dialogue information to be truncated.
How to verify correct configuration
- Generate a response that includes diffusion process parameters and corresponding batch information. Check if citation source identifiers appear at the end of the paragraph.
- Copy the login-free shared link, access it in an unauthenticated browser environment, and try clicking citation links to view original data. Confirm the function works normally.
- Initiate a consecutive dialogue: first ask for the diffusion furnace temperature parameters of a specific batch, then ask for the EL test results of that batch. Check if the response associates the batch information from the previous round.
- Adjust the
quoteMaxTokenparameter to1000 token. Verify that long-text process parameter citations can display source information completely.
The values provided here are common starting points, and should be measured against the reader's own samples.