This document is written based on the configuration logic of FastGPT v4.17.0.
What the Data for This Category Looks Like
Core data for semiconductor packaging and testing includes packaging process cards, bonding and molding parameters, wafer incoming material maps, test program versions, yield reports, failure analysis reports, and similar items. Data sources include wafer test maps, manufacturing execution systems (MES), bonding and molding equipment, ATE test machines, X-ray/SAM inspection equipment, and customer specification requirements. Data is updated according to production batches, individual chip test results, and daily production progress. Different documents have exclusive fields such as batch numbers, parameter thresholds, test bin values, and failure locations. There is no unified general format, and matching exclusive identifiers corresponding to the production link is required.
What Constraints Do These Characteristics Impose on the Source Citation and Traceability Link
Multi-source heterogeneous data sources (equipment, MES, test reports, etc.) require the traceability link to accurately associate batch numbers and parameter fields across different systems, to avoid cross-source matching errors. The high-frequency update feature (per batch, per chip test) requires traceability to support real-time or near-real-time data pulling, and cannot rely on static offline knowledge bases. Exclusive documents (such as wafer incoming material maps, ATE test program versions) must match citations corresponding to the production link, and cannot use generalized retrieval. The feature that errors have serious consequences requires traceability results to be bound to a unique production batch and equipment ID, to ensure traceability.
How to Configure
| Configuration Item | Recommended Approach | Rationale |
|---|---|---|
| Maximum Citation Token Count | Set quoteMaxToken to 700–1100 tokens | Matches the core content length of single documents such as packaging process cards and ATE test reports, to avoid truncating critical parameters |
| Citation Data Filtering | Bind exclusive knowledge bases by production batch, set cache size to 500 MB | Adapts to the high-frequency update feature of per-batch and per-chip testing, avoids referencing invalid data across batches, and controls storage overhead |
| Citation Detail Display | Enable the detail field | Can display exclusive fields such as wafer incoming material map numbers and test program versions, meeting traceability accuracy requirements |
| Citation Source Return | Enable the responseData field | Directly returns device IDs and MES batch numbers from data sources, facilitating quick verification of the production link |
| Recall Result Limit | Top 3–5 recall results | Adapts to the multi-source data association requirement for individual chip tests, avoiding interference from redundant information |
| Retrieval Update Frequency | Once every 60 seconds | Adapts to the real-time update requirement for per-chip testing, ensuring the timeliness of traceability data |
Three Easy-to-Make Errors
- Phenomenon: The citation source displayed in the conversation interface does not include exclusive fields such as wafer incoming material map numbers and test program versions. Cause: The
detailfield configuration is not enabled, and only general summary information of the document is returned. - Phenomenon: Documents from non-current production batches appear in search results, leading to incorrect traceability results. Cause: The rule for filtering knowledge bases by production batch is not configured, and all historical data is mistakenly included in the search scope.
- Phenomenon: A document not included locally is retrieved and displayed as a citation source. Cause: Retrieval is not restricted to exclusive data sources bound to the current production link, leading to calls to unauthorized external data.
How to Confirm Successful Configuration
- Import a packaging process card document, bind it to the knowledge base corresponding to the target production batch, initiate a search, and confirm that the returned results include the exclusive fields of this document.
- After initiating a search, check that the returned citation sources are only bound to the current test batch data sources, with no cross-batch content.
- View the citation module in the conversation interface, and confirm that detailed information required for traceability such as device IDs and MES batch numbers is displayed.
- Test setting the recall result limit to the top 3 entries, and confirm that the number of returned citation entries does not exceed this value.
The values provided are common starting points and should be measured against the reader's own samples.