What This Category of Data Looks Like
This category falls under the post-production process of electronic manufacturing, differing from the front-end microfabrication of wafer manufacturing. Data sources include wafer test maps, MES systems, bonding and molding equipment logs, ATE tester data, X-ray/SAM inspection results, and customer specifications. Daily documents include packaging process cards, bonding and molding parameter tables, incoming wafer maps, test program version files, yield reports, and failure analysis reports. Data is updated per production batch, per individual chip test result, and daily equipment operation logs. Fields include wafer ID, batch number, bin code, equipment runtime, parameter thresholds, and some documents require association with unique identifiers for batches and test results.
Constraints on Forms and Interactions
Data for this category is updated per production batch, per individual chip test result, and daily logs. This requires forms to support fields bound to unique batch numbers and test identifiers, to avoid mixed batches caused by manual input. Multiple data sources require forms to pull structured fields from systems such as MES and ATE testers, reducing duplicate data entry. Scenarios with multiple associated documents require forms to reference parameter items from corresponding documents via variables, while validating that field formats match business document rules. Attributes with severe failure consequences require forms to set required field validation and real-time format prompts, lowering incorrect entry rates.
Configuration Guidelines
This configuration guide is based on FastGPT v4.17.0.
| Configuration Item | Recommended Configuration | Rationale |
|---|---|---|
formInput | Configure for batch number, bin code, and equipment number fields, with input length limited to 10–20 characters | Matches the field formats of incoming wafer maps and test program versions, prevents document association failures caused by overly long characters |
userSelect | Preset options for equipment models and fault types, including category-specific equipment such as bonders, molding machines, and ATE testers | Covers core inspection equipment for semiconductor packaging and testing, reduces the probability of errors from manual input |
| Input guidance vocabulary library | Import a common fault terminology vocabulary library for packaging process cards and failure analysis reports, with no more than 500 vocabulary entries | Matches the terminology system of business documents, improves the accuracy of question-and-answer matching |
| Variable reference validation | Enable field format validation that matches the field types of corresponding documents | Prevents quote type error errors, ensures variable references comply with business rules |
| Form submission trigger | Set to trigger only after all required fields have been verified, with a timeout period set to 30 seconds | Adapts to the inspection workflow rhythm of packaging and testing factories, avoids submission failures caused by timeouts |
Three Common Configuration Errors
- Symptom: Form nodes cannot be called by other workflow branch jumps, and the debug prompt indicates node link incompatibility. Cause: The reusable configuration of the form node is not enabled, and the node is only allowed to be called by the current branch.
- Symptom: After enabling input guidance and importing a custom vocabulary library, an error pop-up appears in the debug preview interface. Cause: The custom vocabulary library contains unescaped special characters, or the number of vocabulary entries exceeds the system’s allowable loading limit.
- Symptom: A
quote type errorerror pops up when referencing knowledge base fields, and the form cannot be submitted normally. Cause: The referenced field format does not match the field type of the business document, and the variable reference validation configuration is not enabled.
How to Confirm Successful Configuration
- Manually input field values conforming to business document formats, and confirm that real-time format validation prompts are activated.
- Trigger a jump to the form node via other workflow branches, and confirm that the link flows normally.
- After importing the custom vocabulary library, input terminology from the vocabulary library in the debug interface, and confirm that corresponding guidance prompts are activated.
- Reference structured fields in the knowledge base, and confirm that corresponding parameters load normally without format errors.
The values provided are common starting points, and should be evaluated against the reader’s own samples.