This page is written based on FastGPT v4.17.0.
What the data for this category looks like
Semiconductor packaging and testing quality traceability data comes from wafer map files, MES systems, bonding and molding equipment logs, ATE tester outputs, X-ray/SAM inspection results, and customer specification documents. Data is synchronized daily based on production batches and individual chip test results. Daily associated documents include packaging process cards, bonding parameter tables, incoming wafer maps, test program version records, yield reports, and failure analysis reports. Data fields include wafer numbers, batch numbers, test bin codes, failure locations, process parameter thresholds, and more, with units adjusted according to corresponding process links.
Constraints on HTTP Interfaces and External Systems
Data for this category has high update frequency and fine granularity. A single production batch generates large volumes of individual chip test and inspection data. HTTP interfaces must support high-frequency requests. Data is associated with multiple sources of equipment and documents. Interfaces must pass core identifiers such as batch numbers, wafer numbers, and test program versions via specified parameters to align wafer maps with physical production batches. Defect analysis requires association between failure analysis reports and test bin distribution data. Interfaces must support returning structured multi-dimensional data fields. Since errors directly affect complete machine delivery, interfaces must have clear status code returns and failure retry mechanisms to ensure accurate data transmission.
How to Configure
| Configuration Item | Recommended Approach | Rationale |
|---|---|---|
Authorization | Include a Bearer token with a 7-day validity period | Aligns with authentication rules for internal systems in packaging and testing factories, avoids frequent token refreshes that impact interface calls |
variables | Pass three core fields: batch number, wafer ID, and test program version | Used to align incoming wafer maps with production batches, meets traceability requirements |
responseData | Return only three fields: bin code, failure location, and process parameters | Reduces invalid data transmission, fits the core data needs of defect analysis |
| Request timeout | 30–60 seconds | Matches the data return cycle of ATE testers, prevents call failures due to device response delays |
| Retry count | 2–3 times | Addresses network fluctuations or temporary device freezes, ensures successful data retrieval |
| Concurrency limit | Set based on actual measurements, initial recommended value is 50–100 concurrent requests | Matches production rhythms in a single workshop of a packaging and testing factory, avoids exceeding the carrying capacity of external systems |
Three Common Misconfigurations
- A
401 Unauthorizederror is returned when calling the interface. This occurs because theAuthorizationparameter is not configured correctly, or the token has expired and was not updated in time. - Corresponding batch data cannot be retrieved via the interface. This occurs because core identifiers such as batch numbers and wafer IDs are not passed in
variables, so the system cannot match the target data. - The number of results returned by the interface does not match the actual test data. This occurs because the
responseDatareturn fields are not restricted, or the concurrency setting exceeds the carrying limit of the external system, causing some requests to be dropped.
How to Confirm Successful Configuration
- A single test request is initiated, and the returned
responseDatais checked to confirm it only includes preset core fields with no redundant data. variablesparameters for a known batch number are passed, and returned data is verified to match batch records in the local MES system.- Continuous requests are sent at the set concurrency limit, and the interface is observed to confirm no consecutive abnormal status codes are returned.
- The
Authorizationtoken is manually refreshed, and interface calls are confirmed to operate normally without being affected by token expiration, with valid data returned.
The values provided here are common starting points and should be measured against the reader's own samples.