What Data for This Category Looks Like
Data sources for this category include fab MES systems, equipment FDC collection modules, defect detection and metrology equipment, process recipe libraries and experimental databases. Daily documents cover process flow cards, batch operation records, equipment recipes, SPC control charts, exception handling sheets, defect atlases and yield reports.
Data update cycles cover each wafer batch transfer node, real-time equipment parameter reporting, and daily summary statistics. Fields include wafer batch identifiers, process node parameters, defect spatial coordinates, and equipment operation timing data. Units involve nanometers, angstroms, milliseconds and other precision measurement scales.
What Constraints Do These Characteristics Impose on HTTP Interfaces and External Systems
The multi-source heterogeneous data, high-frequency updates and precision measurement characteristics of this category impose multiple constraints on HTTP interfaces.
Multi-source docking requirements require interfaces to support cross-system identity verification, and secure authentication rules must be configured. Precision fields and large-volume file data (such as wafer maps, defect atlases) require interfaces to support mixed transmission of binary streams and structured parameters to avoid data truncation. Scenarios with coexisting update cycles require interfaces to adapt to both single batch requests and real-time callback modes, and support data filtering by business dimension. Cross-process traceability requirements require interfaces to return complete associated data links, and the coverage of returned fields must be standardized.
Configuration Settings
This configuration applies to FastGPT v4.17.0.
| Configuration Item | Recommended Setting | Rationale |
|---|---|---|
| Authentication Configuration | Enable Bearer Token authentication, fill the Authorization parameter with a token valid for 12 hours | Adapt to the security requirements of cross-system docking in wafer fabs, avoid token leakage risks |
| Request Parameter Configuration | Bind wafer batch numbers and equipment IDs as core filtering conditions via variables, with no more than 20 parameters per single request | Match the characteristics of wafer manufacturing data organized by batch and equipment, reduce redundant data transmission |
| Response Data Configuration | Configure responseData to return complete associated fields, including identifiers for exception handling sheets and defect atlases | Meet the cross-link association query requirements for quality traceability |
| Timeout Period | 600 seconds | Adapt to the complex query processing duration of wafer batch data |
| File Transfer Limit | 1000 MB | Adapt to the transmission requirements of large-volume files such as wafer maps and defect atlases |
| Retry Count | 3 times | Reduce the impact of network fluctuations during real-time equipment data reporting |
Three Common Mistakes
- Phenomenon: A 400 status code is returned when calling the HTTP interface to upload wafer process documents in markdown format, and the file field is empty. Cause: The Content-Type of the request header is not correctly configured as application/markdown, or the file stream and business identifier are not bound via the
variablesparameter. - Phenomenon: When calling the interface in batch to synchronize FDC data from multiple devices, a database execution error is returned, prompting that multi-line statements are not supported. Cause: The single-line query restriction for interface calls is not turned off, causing batch SQL statements to be blocked.
- Phenomenon: When calling the quality traceability interface, the returned results do not include reference identifiers for associated documents, and source information cannot be displayed. Cause: The associated fields for exception handling sheets and defect atlases are not configured to be returned in
responseData.
How to Confirm the Configuration Is Correct
- Call the interface with the configured authentication parameters. A 200 status code indicates normal authentication configuration.
- Upload a single wafer defect atlas file, check that the file ID returned by the interface matches the business identifier, with no format truncation or data loss.
- Initiate a batch equipment data query request, check that the number of returned results matches the preset filtering conditions, with no redundant or missing fields.
- Call the quality traceability interface, check that the returned results include identifier information for associated documents, which can be used for subsequent source reference display.
The values given are common starting points and should be measured against the reader's own samples.